The AS Division provides a world-leading forum for the design and characterization of the surfaces and interfaces that underpin technologies ranging from medical implants to electronic devices. The session topics include the popular “Applied Surface Science in Action” sessions that provide comprehensive insight and discussion into methods used widely in industry, government, and academic settings. This year, we provide a special focus on “SIMS Applied Surface Science”, highlighting recent innovations and developments in this widely used method. The “Advances in Sputtering” session provides greater detail on the advances in sputtering for several methods in XPS, SIMS, and ISS. The “Characterizing Battery Materials, Surfaces, and Interfaces with Data-Driven and Autonomous Methods” session is part of a mini-symposium on batteries that aims to focus on the surface science characterization of battery interfaces along with the application of thin-film processing in battery systems. The “Complex Data Analysis for Applied Surface Science” session covers up-and-coming topics about the needs for data-driven, complex analysis in Surface Science. The Applied Surface Science Poster Session will capture condensed highlights on all these subjects on Thursday evening.
The division will hold its annual Business Meeting and Awards Ceremony on Tuesday evening. Highlights of this event include the student award competition and the ASTM E42 Committee on Surface Analysis forum. All members of the Applied Surface Science community are invited to attend.
AS-TuM: Applied Surface Science in Action I
- Justin Gorham, National Institute of Standards and Technology (NIST), “Considerations when Developing Standards and Tools for Surface Chemical Analysis”
AS-TuA: Applied Surface Science in Action II
- Elias Nakouzi, Pacific Northwest National Laboratory, “Interfacial Solution Structure Impacts Crystal Growth, Ice Nucleation, and Particle Aggregation”
- Jörg Radnik, Federal Institute for Materials Research and Testing (BAM), Germany, “Quantification of Surface Functional Groups on Nano- and 2D Materials”
AS-WeM: Advances in Sputtering
AS-WeA: ToF SIMS in Applied Surface Science
- David Carr, 3M, “Enhancing Industrial Problem Solving with ToF-SIMS”
AS-ThM: Complex Data Analysis For Applied Surface Science
- Satoka Aoyagi, Seikei University, Japan, “Data-Driven Analysis Using Explainable AI (XAI) for Surface Analysis Data, Including Mass Images”
AS-ThP: Applied Surface Science Poster Session