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Focus Topic: Chemical Analysis and Imaging of Interfaces (CA)

Home Focus Topic: Chemical Analysis and Imaging of Interfaces (CA)

Chemical and physical processes occurring at gas-liquid-plasma-solid interfaces are crucial for many applications, and yet their analysis often represents grand scientific and engineering challenges. The Chemical Analysis and Imaging at Interfaces Focus Topic symposium is designed as a cross-disciplinary “melting pot” and aims to disseminate the latest and emerging developments and trends in experimental methods and understanding of the interfacial physical and chemical processes relevant (but not limited) to device microfabrication, materials synthesis, energy/catalysis research, biomedical applications, environmental sciences, and surface modifications, to name a few. In particular, in (ex-) situ/in vivo/operando chemical imaging, microscopy, and spectroscopy studies using electron, X-ray, ion, and neutron beams, as well as optical methods and synchrotron radiation/ FEL facilities, are strongly encouraged. Attention will also be paid to correlative spectroscopy and microscopy methods, modern image/spectra processing, and AI-enabling data acquisition and analytics techniques. Contributions are invited, including but not limited to experimental, fundamental research, industrial R&D, novel analytical techniques/approaches, and metrology of realistic surfaces and interfaces.

CA-ThP: Chemical Analysis and Imaging at Interfaces Poster Session

CA1-FrM: Chemical Analysis and Imaging at Interfaces Oral Session I

  • Mathew Cherukara, Argonne National Laboratory, “High Performance Computing and Artificial Intelligence Enabled Materials Characterization and Experimental Automation”
  • Vincent Donnelly, University of Houston, “Challenges in Real-Time Plasma-Surface Diagnostics”
  • Alexander Liddle, Canon Nanotechnologies Inc., “Semiconductor Manufacturing Metrology”
  • Sefik Süzer, ÜNİVERSİTELER MAH, Turkey, “Gaede Langmuir Award Talk: Investigation of Solid-Solid and Solid-Liquid Interfaces under Electrical Potential via XPS and EIS “

CA2-FrM: Chemical Analysis and Imaging at Interfaces Oral Session II

  • Andrew Yost, Scienta-Omicron Inc., “Accessing Surfaces and Interfaces in the Modern Scientific Era: An Overview of Important Instrumentation Advances”
  • Sen Zhang, University of Virginia, “Modulating Active Site for Water Electrolysis

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Key Dates

Major Awards Deadline:
March 31, 2026

Student Awards Deadline:
May 18, 2026

Abstract Submission Deadline:
May 18, 2026

Late News Abstract Submission Deadline:
September 14, 2026

Hotel Deadline:
September 30, 2026

Early Registration Deadline:
October 5, 2026

 

Contact

Yvonne Towse
Conference Administrator
125 Maiden Lane; Suite 15B
New York, N.Y. 10038
yvonne@avs.org

 

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